Loading patent…
AssigneeNational Instruments Corporation
InventorsGeoffrey Schmit, Jonathan Brumley, Brent Schwan, Jack Levy
Estimating the term…
A measurements expert system and method for generating a high-performance measurements software driver. The measurements expert system translates a user's measurement task specification (MTS) specifying a measurement task into a solution, e.g., a run-time specification (RTS), suitable for the user's measurement system. The expert system includes programs for analyzing and validating the received MTS, and for generating the RTS. The RTS is useable to configure measurement devices to perform the measurement task, and to generate a run-time which is executable to perform the specified measurement task. The expert system includes a plurality of experts, e.g., device, channel, timing, reader/writer, control, and streaming experts, etc., each class of which manages different aspects of the MTS. The expert system creates a device expert call tree of associated experts according to the configuration specified by the user, manages the configuration of the MTS, verifies the MTS, and compiles the MTS into the RTS.
A memory medium comprising program instructions implementing a measurements expert system, wherein the expert system is operable to perform:
A memory medium comprising program instructions implementing a measurements expert system, operable to:
A method for configuring a measurement system to perform a measurement task, the method comprising:
An expert system for generating a measurement program specification, comprising:
An expert system for generating a measurement program specification, comprising:
A system for generating a measurement program, comprising:
Dependencies are inferred from the claim text.