Universally accessible fully programmable memory built-in self-test (MBIST) system and method

A universally accessible fully programmable memory built-in self-test (MBIST) system, the system comprising:

• an MBIST controller including:
• an address generator configured to generate addresses for a memory under test;
• a sequencer circuit configured to deliver test data to selected addresses of said memory under test and reading out that test data, and
• a comparator circuit configured to compare said test data read out of said memory under test to said test data delivered to said memory under test to identify a memory failure;
• an externally accessible user programmable pattern register remote from said MBIST controller for providing a pattern of test data to said memory under test;
• and
• an external pattern programming device configured to supply said pattern of test data for said user programmable data pattern register.

A universally accessible fully programmable memory built-in self-test (MBIST) method, the method comprising:

• generating addresses for a memory under test;
• generating for an externally accessible user programmable pattern register a pattern of test data with an external pattern programming device;
• programming said user programmable pattern register with said pattern of test data to said memory under test;
• delivering test data to selected addresses of said memory under test;
• reading out said test data from said selected addresses of said memory under test;
• and
• comparing said test data read out of said memory under test to said test data delivered to said memory under test to identify a memory failure.