Method of analyzing electromagnetic interference
AssigneeMatsushita Electric Industrial Co., Ltd.
InventorsKenji Shimazaki, Hiroyuki Tsujikawa, Seijirou Kojima, Shouzou Hirano
Life of this patent
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Abstract
In contrast with a known dynamic gate-level simulation method, a method of analyzing electromagnetic interference (an EMI analysis method) according to the present invention enables estimation of EMI noise, by means of calculating signal propagation of each node through use of the signal propagation probability technique, and calculating variation time of each node through use of “the Static timing analysis technique”. In short, the present invention is characterized in calculating a frequency characteristic from the relationship between toggle probability of each node and delay in each node.
Claims11
A simulation method of analyzing electromagnetic interference developing in an LSI, comprising:
- a correction step of correcting the amplitude of a current estimation waveform in each simulated node which has been previously prepared for each change in each simulated node, in accordance with the probability of variation in each simulated node;
- an addition step of adding current waveforms of all simulated nodes together within a period of time corresponding to one cycle, provided that the thus-corrected current waveform appears at time a signal arrives at each simulated node;
- and
- a frequency analysis step of analyzing the frequency of the current waveform calculated in the addition step.
A method of analyzing electromagnetic interference developing in an LSI, the method comprising:
- a waveform formation step of forming a current estimation waveform which has been prepared for each change in each simulated node, as if the waveform randomly arises within a plurality of predetermined cycles, in accordance with the probability of change in each simulated node and a time at which a signal arrives at each simulated node;
- adding the thus-prepared current estimation waveforms of all simulated nodes, to thereby derive a current waveform;
- and
- analyzing the frequency of the current waveform, thereby determining a noise characteristic of EMI.
A method of analyzing electromagnetic interference developing in an LSI, the method comprising:
- a waveform formation step of forming a current estimation waveform which has been prepared for each change in each simulated node, as if the waveform randomly arises within a plurality of predetermined cycles, in accordance with the probability of change in each simulated node and a distribution probability of time;
- adding the thus-prepared current estimation waveforms of all simulated nodes, to thereby derive a current waveform;
- and
- analyzing the frequency of the current waveform, thereby determining a noise characteristic of EMI.
A simulation method of analyzing electromagnetic interference developing in an LSI, comprising:
- a correction step of correcting the amplitude of a current estimation waveform in each simulated node which has been previously prepared for each change in each simulated node, in accordance with the probability of variation in each simulated node;
- an addition step of adding current waveforms of all simulated nodes together within a period of time corresponding to one cycle, provided that thus-corrected current waveform appears at time a single arrives at each simulated node.
A simulation method of analyzing electromagnetic interference developing in an LSI, comprising:
- a correction step of correcting the amplitude of a current estimation waveform in each simulated node which has been previously prepared for each change in each simulated node, in accordance with the probability of variation in each simulated node;
- an addition step of adding current waveforms of all simulated nodes together within a period of time corresponding to one cycle, provided that thus-corrected current waveform appears at time a single arrives at each simulated node;
- and
- a voltage-Drop analysis step of analyzing the Voltage-Drop of the current waveform calculated in the addition step.
A simulation method of analyzing electromagnetic interference developing in an LSI, comprising:
- a correction step of correcting the amplitude of a current estimation waveform in each simulated node which has been previously prepared for each change in each simulated node, in accordance with the probability of variation in each simulated node;
- an addition step of adding current waveforms of all simulated nodes together with a period of time corresponding to one cycle, provided that thus-corrected current waveform appears at time a single arrives at each simulated node;
- and
- a power consumption analysis step of analyzing the power consumption of the current waveform calculated in the addition step.
Dependencies are inferred from the claim text.