Multipurpose testing system for optical cross connect devices

An optical switch testing system (OSTS) for testing a device under test (DUT), the DUT including a plurality of DUT optical input ports and a plurality of DUT optical output ports, the system comprising:

• at least one processor;
• memory;
• a plurality of OSTS output ports, wherein a selected plurality of the OSTS output ports are each optically connected to a respective DUT input port;
• a plurality of OSTS input ports, wherein a selected plurality of the OSTS input ports are each optically connected to a respective DUT output port;
• an optical test stimulation component configured or designed to generate optical test signals to be transmitted to a selected plurality input ports of the DUT;
• an optical test detection component configured or designed to detect a presence or absence of light on a selected plurality output ports of the DUT, wherein the optical test detection component includes a plurality of photo detectors and a plurality of demodulator circuits configured or designed measure properties associated with light detected at a plurality of selected DUT output ports, wherein the plurality of demodulator circuits includes at least 8 separate demodulator circuits.

An optical switch testing system (OSTS) for testing a device under test (DUT), the DUT including a plurality of DUT optical input ports and a plurality of DUT optical output ports, the system comprising:

• at least one processor;
• memory;
• a plurality of OSTS output ports, wherein a selected plurality of the OSTS output ports are each optically connected to a respective DUT input port;
• a plurality of OSTS input ports, wherein a selected plurality of the OSTS input ports are each optically connected to a respective DUT output port;
• an optical test stimulation component configured or designed to generate optical test signals to be transmitted to a selected plurality input ports of the DUT;
• an optical test detection component configured or designed to detect a presence or absence of light on a selected plurality output ports of the DUT, wherein the optical test detection component includes a plurality of photo detectors and a plurality of demodulator circuits configured or designed measure properties associated with light detected at a plurality of selected DUT output ports, and
• a polarization scambler configured or designed to scramble or randomize a state of polarization of test optical signals generated by the OSTS.

A method for performing testing of an optical device under test (DUT), the DUT including a plurality of DUT optical input ports and a plurality of DUT optical under output ports, the testing being performed by an optical switching testing system (OSTS), the OSTS including a plurality of OSTS output ports optically connected to a plurality of DUT input ports, the OSTS further including a plurality of OSTS input ports optically connected to a plurality of DUT output ports, the method comprising:

• configuring components of the OSTS in order to perform a specific test on the DUT;
• configuring a first test scenario at the OSTS;
• transmitting at least one optical test signal to at least one DUT input port;
• obtaining test results by monitoring at least one DUT output port for the presence or absence of light;
• analyzing the test results for specific characteristics;
• and
• performing at least one of optical cross-talk testing, insertion loss testing or path switching time testing on the DUT.

An optical switch testing system (OSTS) for testing a device under test (DUT), the DUT including a plurality of DUT optical input ports and a plurality of DUT optical output ports, the system comprising:

• at least one processor;
• memory;
• a plurality of OSTS output ports, wherein a selected plurality of the OSTS output ports are each optically connected to a respective DUT input port;
• a plurality of OSTS input ports, wherein a selected plurality of the OSTS input ports are each optically connected to a respective DUT output port;
• an optical test stimulation component configured or designed to generate optical test signals to be transmitted to a selected plurality input ports of the DUT;
• and
• an optical test detection component configured or designed to detect a presence or absence of light on a selected plurality output ports of the DUT;
• the system being configured or designed to configure components of the OSTS in order to perform a specific test on the DUT;
• the system being further configured or designed to configure a first test scenario at the DUT;
• the system being further configured or designed to transmit at least one optical test signal to at least one DUT input port;
• the system being further configured or designed to obtain test results by monitor at least one DUT output port for the presence or absence of light;
• the system being further configured or designed to analyze the test results for specific characteristics;
• and
• the system being further configured or designed to automatically perform at least one of (i) a plurality of separate optical cross-talk testing operations on a selected plurality of different optical paths associated with the DUT, (b) a plurality of separate insertion loss testing operations on a selected plurality of different optical paths associated with the DUT or (c) a plurality of separate path switching time testing operations on a selected plurality of different optical paths associated with the DUT.

An optical switch testing system (OSTS) for testing a device under test (DUT), the DUT including a plurality of DUT optical input ports and a plurality of DUT optical output ports, the system comprising:

• at least one processor;
• memory;
• a plurality of OSTS output ports, wherein a selected plurality of the OSTS output ports are each optically connected to a respective DUT input port;
• a plurality of OSTS input ports, wherein a selected plurality of the OSTS input ports are each optically connected to a respective DUT output port;
• an optical test stimulation component configured or designed to generate optical test signals to be transmitted to a selected plurality input ports of the DUT;
• an optical test detection component configured or designed to detect a presence or absence of light on a selected plurality output ports of the DUT;
• means for configuring components of the OSTS in order to perform a specific test on the DUT;
• means for configuring a first test scenario at the DUT;
• means for transmitting at least one optical test signal to at least one DUT input port;
• means for obtaining test results by monitoring at least one DUT output port for the presence or absence of light;
• means for analyzing the test results for specific characteristics;
• and
• means for automatically performing a plurality of separate testing operations on a selected plurality of different optical paths associated with the DUT, wherein the testing operations are selected from the group consisting of optical cross-talk testing operations, insertion loss testing operations and separate path switching time testing operations.