Systems and methods for analyzing particle systems of surface facets using polarized scattered light
AssigneeThe United States of America as represented by the Secretary of the Army
InventorGorden Videen
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Abstract
Methods for analyzing particle systems of surface facets using polarized scattered light are provided. An exemplary method comprises the steps of: providing models of multiple arbitrary particle systems, the particle system comprising surface facets; performing ray-trace analysis with respect to the models over a range of back-scatter angles, the ray-trace analysis involving only use of second-order rays; receiving information corresponding to a particle system of interest; and predicting at least one characteristic of the particle system of interest using information generated during the ray-trace analysis. Systems and other methods are provided.
Claims20
A method for analyzing particle systems of surface facets using polarized scattered light, said method comprising the steps of:
- providing models of multiple particle systems, the particle systems comprising surface facets;
- performing ray-trace analysis with respect to the models over a range of scatter angles, the ray-trace analysis involving only use of second-order rays;
- receiving information corresponding to a particle system of interest;
- and
- predicting at least one characteristic of the particle system of interest using information generated during the ray-trace analysis.
A method for analyzing particle systems of surface facets using polarized scattered light, said method comprising the steps of:
- calculating relationships between polarization states and back-scatter angles with respect to multiple arbitrary particle systems, at least some of the particle systems comprising surface facets;
- receiving information corresponding to a particle system of interest;
- correlating the information received with the relationships calculated to determine a best fit based, at least in part, on a minimum value of the polarization state of the particle system of interest;
- and
- using the best fit to estimate at least one characteristic of the particle system of interest.
A computer-readable medium having a computer program stored thereon, the computer program being executable to perform computer-implemented method steps, said method steps comprising:
- receiving information corresponding to a model of a particle system that comprises surface facets;
- generating information corresponding to polarization state and back-scatter angle of the model at multiple separation parameters (l) using second-order ray-trace analysis;
- receiving information corresponding to a particle system of interest;
- and
- predicting at least one characteristic of the particle system of interest using the information generated.
A computer-readable medium having a computer program stored thereon, the computer program being executable to perform computer-implemented method steps, said method steps comprising:
- calculating relationships between polarization states and back-scatter angles with respect to multiple arbitrary particle systems, at least some of the particle systems comprising surface facets;
- receiving information corresponding to a particle system of interest;
- correlating the information received with the relationships calculated to determine a best fit based, at least in part, on a minimum value of the polarization state of the particle system of interest;
- and
- using the best fit to estimate at least one characteristic of the particle system of interest.
A system for analyzing a particle system using polarized scattered light comprises:
- a model of multiple particle systems comprising surface facets, the model being configured to provide information corresponding to polarization state and back-scatter angle of the multiple particle systems at multiple separation parameters (l) using second-order ray-trace analysis;
- and
- a computer operative to access the model, the computer being further operative to:
- receive information corresponding to a particle system of interest;
- and
- predict at least one characteristic of the particle system of interest using the information provided by the model.
Dependencies are inferred from the claim text.