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US 6,958,768 B1Granted
CMOS inspection apparatus
AssigneeASTI Holdings Limited
InventorsSreenivas Rao, Noor Ashedah Binti Jusoh
Life of this patent
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Abstract
A system for inspecting components is provided. The system includes a CMOS imaging system generating image data, such as pixel data from a pixel array. An image analysis system is connected to the CMOS imaging system, the image analysis system receiving the image data and generating image analysis data. The CMOS imaging system generates the image data at a rate that allows the CMOS imaging device to be used for inspecting components.
Claims15
A system for inspecting components comprising:
- a CMOS imaging system generating image data;
- an image analysis system coupled to the CMOS imaging device, the image analysis system receiving the image data and generating image analysis data;
- a processor coupled to the image analysis system, the processor operating one or more additional software systems used for image data analysis, wherein the processor, the image analysis system, and the CMOS imaging system are an embedded imaging system;
- and
- wherein the CMOS imaging system generates the image data at a rate that allows the CMOS imaging device to be used for inspecting components in response to line shift control data received from the image analysis system.
2 more elements
A method for generating image data of a component for use in inspecting the component comprising:
- generating pixel data using a CMOS imaging system;
- transferring the pixel data as a plurality of pixel lines, further comprising
- generating a reset command;
- initiating a pixel line at the next clock cycle after the reset command;
- waiting a predetermined number of clock cycles to generate a next pixel line;
- and
- wherein the predetermined number of clock cycles is less than 208 clock cycles;
- assembling the pixel lines into a frame;
- and
- wherein the frame is assembled in less than 30 milliseconds.
7 more elements
Dependencies are inferred from the claim text.