Inspecting apparatus and inspecting method for circuit board
AssigneeOHT Inc.
InventorsShuji Yamaoka, Shogo Ishioka
Life of this patent
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Abstract
The present invention provides an apparatus and method for inspecting a circuit board at a high speed. A PDP driver module 100 as an object to be inspected has an onboard PDP driving LSI 110. A plurality of circuit wirings 111 are connected to terminals of the LSI. An inspection apparatus 1 generates an LSI drive signal and sends it to input terminals 113 of the LSI 110. A sensor 2 is positioned opposedly to the circuit wirings 111 in a non-contact manner. The sensor 2 detects voltage values in circuit wirings 111 caused by driving the LSI 110, and the detected signals are analyzed by the inspection apparatus 1.
Claims33
An apparatus for inspecting a circuit board incorporating an integrated circuit, comprising:
- drive means for forcibly driving said integrated circuit to generate output signals sequentially from a plurality of output terminals of said integrated circuit;
- detect means for detecting in a non-contact manner a voltage value in a plurality of circuit wirings connected to said output terminals;
- comparison means for comparing said voltage value to a normal value;
- and
- defect determination means for determining a defect in said circuit wirings according to the comparison result in said comparison means,
- wherein the detect means detects the voltage value by obtaining a capacitance value.
An apparatus for inspecting a circuit board for use in a PDP driver, comprising:
- detect means for detecting in a non-contact manner a voltage waveform in all of circuit wirings connected in a one-on-one arrangement to terminals of an LSI for use in a PDP driver;
- determination means for determining whether or not the detected voltage waveform has a normal shape;
- and
- identification means responsive to the determination of an abnormality in the voltage waveform to identify defective one or ones of said circuit wirings according to the timing of occurrence of said abnormal waveform.
A method for inspecting a circuit board incorporating an integrated circuit, comprising the steps of:
- forcibly driving said integrated circuit to generate output signals sequentially from a plurality of output terminals of said integrated circuit;
- detecting in a non-contact manner a voltage value in a plurality of circuit wirings connected to said output terminal;
- comparing the detected voltage value to a given value;
- and
- determining a defect in said circuit wirings according to the comparison result in said comparing step;
- wherein the detecting comprises detecting the voltage value by obtaining a capacitance value.
A method for inspecting a circuit board for use in a PDP driver, comprising the steps of:
- detecting in a non-contact manner a voltage waveform in all of circuit wirings connected in a one-on-one arrangement to terminals of an LSI for use in a PDP driver;
- determining whether or not the detected voltage waveform has a normal shape;
- and
- responsive to the determination of an abnormality in the voltage waveform, identifying defective one or ones of said circuit wirings according to the timing of occurrence of said abnormal waveform.
Dependencies are inferred from the claim text.