US 6,958,613 B2 · Method for calibrating semiconductor devices using a common calibration reference and a calibration circuit

Abstract

Interface parameters for a plurality of semiconductor devices, particularly parameters for output drivers (i.e. on chip driver) and terminations (i.e. on die termination) for double data rate dynamic random access memories, are aligned using a calibration reference which is common to the semiconductor devices and is connected to calibration connections on the semiconductor devices. The semiconductor devices are calibrated in succession, in each case individually, and the calibration connection on the respective semiconductor device which is currently performing calibration is connected to an internal calibration unit by an internal switching unit in the process, and the calibration connections on all other semiconductor devices are terminated to a high impedance internally.

Claims14

Dependent claims

A method for calibrating interface devices, which comprises the steps of:

a) providing a plurality of semiconductor devices each having the interface devices, a calibration unit connected to the interface devices, a calibration connection, a calibration path connected to the calibration connection, and a switching unit disposed in the calibration path for controlling and switching the calibration path;
b) generating, in a first semiconductor device of the semiconductor devices, an active calibration signal connecting the calibration unit to the calibration connection using the switching unit;
c) calibrating the interface devices in the first semiconductor device;
d) generating a passive calibration signal isolating the calibration unit from the calibration connection using the switching unit;
and
e) repeating steps b), c) and d) for all further semiconductor devices of the semiconductor devices.

3 more elements

Dependencies are inferred from the claim text.

Method for calibrating semiconductor devices using a common calibration reference and a calibration circuit

Life of this patent

Method for calibrating semiconductor devices using a common calibration reference and a calibration circuit

Life of this patent

Abstract

Claims14