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US 6,958,598 B2Granted
Efficient switching architecture with reduced stub lengths
AssigneeTeradyne, Inc.
InventorFang Xu
Life of this patent
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Abstract
A switching topology for communicating signals in an automatic test system includes a plurality of switching circuits each for selectively passing signals or crossing signals. Switching circuits are connected together such that each node of any switching circuit connects to no more than one node of any other switching circuit. This topology offers improved signal integrity, reduced cost, and reduced space as compared with conventional, matrix-style switching topologies.
Claims8
A switching topology for automatic test equipment, comprising:
- a plurality of switching circuits each having first through fourth nodes, wherein the first and second nodes are connectable to the third and fourth nodes, respectively, to form a THROUGH connection, or to the fourth and third nodes, respectively, to form a CROSSED connection,
- wherein each of the first through fourth nodes of any of the plurality of switching circuits is connected to at most one of the first through fourth nodes of all the others of the plurality of switching circuits and each of the plurality of switching circuits comprises first and second switching elements each having a common point and first and second connection points to which the common point is selectively connectable.
Dependencies are inferred from the claim text.