N-channel LDMOS with buried p-type region to prevent parasitic bipolar effects
AssigneeTexas Instruments Incorporated
InventorsPhilip L. Hower, Taylor R. Efland
Life of this patent
Estimating the term…
Abstract
An improved n-channel integrated lateral DMOS (10) in which a buried body region (30), beneath and self-aligned to the source (18) and normal body diffusions, provides a low impedance path for holes emitted at the drain region (16). This greatly reduces secondary electron generation, and accordingly reduces the gain of the parasitic PNP bipolar device. The reduced regeneration in turn raises the critical field value, and hence the safe operating area.
Claims8
An n-channel DMOS transistor source structure, comprising:
- an n-type source diffusion, ohmically connected to a source metallization;
- a p-type surface body diffusion which laterally surrounds at least part of said source diffusion;
- a conductive gate structure which is capacitively coupled to part of said p-type surface body diffusion to define a channel region therein;
- a p-type buried body diffusion which underlies said channel and said conductive gate structure and at least part of said surface body diffusion;
- and
- an ohmic connection between said buried body diffusion and said source metallization;
- whereby said buried body diffusion diverts hole current to bypass said source diffusion, and thereby reduces emission of secondary electrons, and thereby increases the safe operating area of the device.
An n-channel DMOS transistor source structure, comprising:
- an n-type source diffusion, ohmically connected to a source metallization;
- a p-type surface body diffusion which laterally surrounds at least part of said source diffusion;
- a conductive gate structure which is capacitively coupled to part of said p-type surface body diffusion to define a channel region therein;
- a p-type buried body diffusion which underlies said channel and at least part of said surface body diffusion wherein said buried body diffusion is self-aligned to at least part of said source diffusion;
- and
- an ohmic connection between said buried body diffusion and said source metallization;
- whereby said buried body diffusion diverts hole current to bypass said source diffusion, and thereby reduces emission of secondary electrons, and thereby increases the safe operating area of the device.
An n-channel DMOS transistor source structure, comprising:
- an n-type source diffusion, ohmically connected to a source metallization;
- a p-type surface body diffusion which laterally surrounds at least part of said source diffusion;
- a conductive gate structure which is capacitively coupled to part of said p-type surface body diffusion to define a channel region therein;
- a p-type buried body diffusion which underlies said conductive gate structure and at least part of said surface body diffusion;
- and
- an ohmic connection between said buried body diffusion and said source metallization;
- whereby said buried body diffusion diverts hole current to bypass said source diffusion, and thereby reduces emission of secondary electrons, and thereby increases the safe operating area of the device.
An n-channel DMOS transistor source structure, comprising:
- an n-type source diffusion, ohmically connected to a source metallization;
- a p-type surface body diffusion which laterally surrounds at least part of said source diffusion;
- a conductive gate structure which is capacitively coupled to part of said p-type surface body diffusion to define a channel region therein;
- a p-type buried body diffusion which underlies said conductive gate structure and at least part of said surface body diffusion wherein said buried body diffusion is self-aligned to a least part of said source diffusion;
- and
- an ohmic connection between said buried body diffusion and said source metallization;
- whereby said buried body diffusion diverts hole current to bypass said source diffusion, and thereby reduces emission of secondary electrons, and thereby increases the safe operating area of the device.
Dependencies are inferred from the claim text.