Back to results
US 6,958,475 B1Granted
Electron source
OwnerSteven M. Colbyinventor
Life of this patent
Estimating the term…
Abstract
A filament assembly configured for generating electrons and including nanoparticles and/or nanofilaments. The filament assembly is optionally incorporated an analytical systems such as a mass analyzer or x-ray source. The nanoparticles and/or nanofilaments are configured to produce improved electron generation, thermal stability, and/or other properties relative to the prior art. Methods of using the filament assembly are described.
Claims36
A mass analyzer comprising an electron source, the electron source including:
- an electron filament coupled to an electrical supply, the electron filament including a conductive wire or conductive ribbon, the electron filament configured to generate electrons when heated and configured to generate electrons while a background pressure in the source is greater than 1.0×10−5 Torr;
- a plurality of nanofilaments disposed on the surface of the electron filament;
- and
- a filament body for positioning the electron filament relative to a mass filter.
1 more element
A mass analyzer comprising an electron source, the electron source including:
- an electron filament coupled to an electrical supply configured to pass a current through the electron filament;
- a plurality of nanofilaments disposed on the surface of the electron filament;
- a filament body for positioning the electron filament relative to a mass filter;
- and
- a magnetic field configured for directing electrons generated using the electron filament.
2 more elements
A mass analyzer comprising an electron source, the electron source including:
- an electron filament coupled to an electrical supply configured to pass a current through the electron filament;
- a plurality of nanofilaments disposed on the surface of the electron filament;
- a filament body for positioning the electron filament relative to a mass filter;
- and
- means for directing electrons generated using the electron filament;
- wherein the electron source is configured such that the directed electrons are accelerated to an energy of approximately 70 electron volts.
3 more elements
A filament assembly comprising:
- an electron filament coupled to an electrical supply configured to provide a current through the electron filament and to hold the electron filament at a potential of approximately 70 Volts relative to part of an electron source;
- a plurality of nanofilaments disposed on the surface of the electron filament;
- and means for positioning the electron filament.
An analysis system comprising:
- an electron filament coupled to an electrical supply configured to pass a current through the electron filament and to hold the electron filament at a potential of approximately 70 Volts relative to an other part of the analysis system, the electron filament including a conductive wire or conductive ribbon, the electron filament configured to generate electrons when heated;
- a plurality of nanofilaments disposed on the surface of the electron filament;
- a filament body for positioning the electron filament relative to the other part of the analysis system;
- means for directing electrons generated using the electron filament;
- a mass filter configured to filter ions generated using the generated electrons;
- and
- an ion detector configured to detect the filtered ions.
4 more elements
A method of analyzing a sample comprising:
- generating electrons with energy of approximately 70 eV, using an electron filament coupled to an electrical supply configured to pass a current through the electron filament and to hold the electron filament at an approximate potential, the electron filament including a conductive wire or conductive ribbon, the electron filament further including a plurality of nanofilaments disposed on the surface of the electron filament;
- causing the generated electrons to contact the sample;
- ionizing the sample using the generated electrons, to produce ions;
- separating the produced ions;
- and
- detecting the separated ions.
3 more elements
A method of analyzing a sample comprising:
- generating electrons using an electron filament coupled to an electrical supply configured to pass a current through the electron filament and to hold the electron filament at an approximate potential, the electron filament including a conductive wire or conductive ribbon, the electron filament further including a plurality of nanofilaments disposed on the surface of the electron filament;
- causing the generated electrons to contact an ion in a region with a background pressure of greater than 1×10−4 Torr;
- fragmenting the ion using the generated electrons, to produce an ion fragment;
- filtering the produced ion fragment;
- and
- detecting the filtered ion fragment.
3 more elements
A filament assembly comprising:
- an electron filament configured to be coupled to an electrical supply for providing a current through the electron filament and for holding the electron filament at a potential relative to part of an electron source;
- and
- a plurality of nanoparticles disposed within the electron filament.
Dependencies are inferred from the claim text.