Method for making a socket to perform testing on integrated circuits
AssigneeFormFactor, Inc.
InventorsIgor Y. Khandros, Gaetan L. Mathieu, Carl V. Reynolds
Life of this patent
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AssigneeFormFactor, Inc.
InventorsIgor Y. Khandros, Gaetan L. Mathieu, Carl V. Reynolds
Estimating the term…
A interconnect structure is inexpensively manufactured and easily insertable into a socket. The interconnect structure is manufactured by forming a sacrificial substrate with cavities that is covered by a masking material having openings corresponding to the cavities. A first plating process is performed by depositing conductive material, followed by coupling wires within the openings and performing another plating process by depositing more conductive material. The interconnect structure is completed by first removing the masking material and sacrificial substrate. Ends of the wires are coupled opposite now-formed contact structures to a board. To complete the socket, a support device is coupled to the board to hold a tested integrated circuit.
A method comprising the steps of:
The method of 1, wherein said fabricating a contact elements step comprises the steps of:
Dependencies are inferred from the claim text.