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US 6,907,358 B2Granted
Eddy current inspection method
AssigneeGeneral Electric Company
InventorsUi Won Suh, Clifford Sneed, Jr.
Life of this patent
Estimating the term…
Abstract
A specimen is mounted in a multiaxis machine. An eddy current probe is also mounted in the machine for multiaxis movement relative to the specimen. The probe is aligned in situ with a target in the specimen by direct contact therebetween at multiple alignment sites corresponding with a numerical model of the specimen. Eddy current inspection of the target may then be conducted by moving the probe along multiple inspection sites of the target corresponding with the specimen model.
Claims20
A method for inspecting a specimen comprising:
- mounting said specimen in a multiaxis machine;
- mounting an eddy current probe in said machine for multiaxis movement relative to said specimen;
- repositioning said probe at multiple alignment sites along said target and obtaining corresponding coordinates therefor;
- defining a reference origin for said target from said coordinates to correspond with a numerical model of said specimen;
- and
- conducting eddy current inspection of said target by moving said probe along multiple inspection sites of said target corresponding with said specimen model relative to said reference origin.
3 more elements
A method for inspecting a specimen comprising:
- mounting said specimen in a multiaxis machine;
- mounting an eddy current probe in said machine for multiaxis movement relative to said specimen;
- aligning said probe in situ with a target in said specimen by direct contact therebetween at multiple alignment sites corresponding with a numerical model of said specimen;
- and
- conducting eddy current inspection of said target by moving said probe along multiple inspection sites of said target corresponding with said specimen model.
2 more elements
Dependencies are inferred from the claim text.