Refractive projection objective for immersion lithography
AssigneeCarl Zeiss SMT GmbH
InventorsHans-Juergen Rostalski, Wilhelm Ulrich
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AssigneeCarl Zeiss SMT GmbH
InventorsHans-Juergen Rostalski, Wilhelm Ulrich
Estimating the term…
A purely refractive projection objective suitable for immersion micro-lithography is designed as a single-waist system with five lens groups, in the case of which a first lens group with a negative refracting power, a second lens group with a positive refracting power, a third lens group with a negative refracting power, a fourth lens group with a positive refracting power and a fifth lens group with a positive refracting power are provided. The system aperture is in the region of maximum beam diameter between the fourth and the fifth lens group. Embodiments of projection objectives according to the invention achieve a very high numerical aperture of NA>1 in conjunction with a large image field, and are distinguished by a good optical correction state and moderate overall size. Pattern widths substantially below 100 nm can be resolved when immersion fluids are used between the projection objective and substrate in the case of operating wavelengths below 200 nm.
Refractive projection objective for projecting a pattern arranged in an object plane of the projection objective into an image plane of the projection objective with the aid of an immersion medium which is arranged between a last optical element of the projection objective and the image plane, comprising:
Projection exposure machine for microlithography, having a refractive projection objective for projecting a pattern arranged in an object plane of the projection objective into an image plane of the projection objective with the aid of an immersion medium which is arranged between a last optical element of the projection objective and the image plane, comprising:
Method for producing semiconductor components and other finely structured structural elements comprising:
Refractive projection objective for projecting a pattern arranged in an object plane of the projection objective into an image plane of the projection objective with the aid of an immersion medium which is arranged between a last optical element of the projection objective and the image plane, comprising:
Projection exposure machine for microlithography, having a refractive projection objective for projecting a pattern arranged in an object plane of the projection objective into an image plane of the projection objective with the aid of an immersion medium which is arranged between a last optical element of the projection objective and the image plane, comprising:
Method for producing semiconductor components and other finely structured structural elements comprising:
Refractive projection objective for projecting a pattern arranged in an object plane of the projection objective into an image plane of the projection objective with the aid of an immersion medium which is arranged between a last optical element of the projection objective and the image plane, comprising:
Refractive projection objective for projecting a pattern arranged in an object plane of the projection objective into an image plane of the projection objective with the aid of an immersion medium which is arranged between a last optical element of the projection objective and the image plane, comprising:
Refractive projection objective for projecting a pattern arranged in an object plane of the projection objective into an image plane of the projection objective with the aid of an immersion medium which is arranged between a last optical element of the projection objective and the image plane, comprising:
Refractive projection objective for projecting a pattern arranged in an object plane of the projection objective into an image plane of the projection objective, comprising:
Dependencies are inferred from the claim text.