Arrangement for examining microscopic preparations with a scanning microscope, and illumination device for a scanning microscope
AssigneeLeica Microsystems Heidelberg GmbH
InventorsHolger Birk, Rafael Storz
Life of this patent
Estimating the term…
Abstract
The arrangement for examining microscope preparations with a scanning microscope comprises a laser (1) and an optical means (12) which images the light generated by the laser (1) onto a specimen (13) that is to be examined. Provided between the laser (1) and the optical means (12) is an optical component (3, 20) that spectrally spreads, with a single pass, the light generated by the laser (1). The optical component (3, 20) is made of photonic band-gap material. It is particularly advantageous if the photonic band-gap material is configured as a light-guiding fiber (20).
Claims25
A scanning microscope comprising:
- a laser configured to generate light having a wavelength range;
- an optical means for imaging light generated by the laser onto a specimen;
- and
- an optical component positioned between the laser and the optical means,
- wherein the light generated by the laser passes through the optical component, and
- wherein the optical component is configured to increase said wavelength range of said light to a substantial portion of the entire visible wavelength range.
A confocal scanning microscope comprising:
- a laser configured to generate light having a wavelength range;
- an optical means for imaging light generated by the laser onto a specimen;
- a detector configured to receive light from the specimen;
- and
- an optical component positioned between the laser and the optical means,
- wherein the light generated by the laser passes through the optical component,
- wherein the optical component is configured to increase said wavelength range of said light to a substantial portion of the entire visible wavelength range, and
- wherein the optical component comprises an illumination pinhole through which the specimen is illuminated by the light emerging from the optical component.
A scanning microscope comprising:
- a pulsed laser configured to generate light having a wavelength range;
- an optical means for imaging light generated by the pulsed laser onto a specimen;
- and
- a light-guiding fiber, made of photonic band-gap material, positioned between the pulsed laser and the optical means,
- wherein the light generated by the pulsed laser passes through the light-guiding fiber, and
- wherein the light-guiding fiber is configured to increase said wavelength range of said light to a substantial portion of the entire visible wavelength range.
A scanning microscope comprising:
- a pulsed laser configured to generate light having a wavelength range;
- an optical means for imaging light generated by the pulsed laser onto a specimen;
- an optical component positioned between the pulsed laser and the optical means, wherein the light generated by the pulsed laser passes through the optical component, and wherein the optical component is configured to increase said wavelength range of said light to a substantial portion of the entire visible wavelength range;
- and
- means arranged after the optical component for attenuating at least a portion of at least one wavelength of the light emerging from the optical component.
A scanning microscope comprising:
- a laser configured to generate light having a wavelength range;
- an imaging optics configured to image light generated by the laser onto a specimen;
- and
- an optical component positioned between the laser and the imaging optics,
- wherein the light generated by the laser passes through the optical component, and
- wherein the optical component is configured to increase said wavelength range of said light to a substantial portion of the entire visible wavelength range.
Dependencies are inferred from the claim text.