Interferometry system having a dynamic beam steering assembly for measuring angle and distance
AssigneeZygo Corporation
InventorHenry A. Hill
Life of this patent
Estimating the term…
Loading patent…
AssigneeZygo Corporation
InventorHenry A. Hill
Estimating the term…
In one aspect, the invention features an angle-measuring interferometry system that includes an interferometer which during operation directs a measurement beam to contact a measurement object, the interferometer comprising a beam steering assembly having a beam steering element positioned to contact and direct the measurement beam and an electronic positioning system to selectively orient the beam steering element within the interferometer. The angle-measuring interferometry system also includes an angle measurement system which during operation calculates a change in angular orientation of the measurement object based on a measurement signal derived from the measurement beam, wherein the measurement signal is derived from at least one interferometric signal produced by combining at least a portion of the measurement beam with a second beam after the measurement beam contacts the measurement object.
An angle-measuring interferometry system comprising:
An interferometry system comprising:
An angle-measuring interferometry system comprising:
An interferometry system comprising:
An interferometry system comprising:
An angle-measuring interferometry system comprising:
An angle-measuring interferometry system comprising:
An angle-measuring interferometry system comprising:
An angle-measuring interferometry system comprising:
An angle-measuring interferometry system comprising:
Dependencies are inferred from the claim text.