Method for measuring polarization dependent loss and insertion loss
AssigneesITF Technologies Optiques Inc., ITF Optical Technologies Inc.
InventorsStéphane Caplette, Sylvain Cloutier, Charles Massicotte, Alain Villeneuve
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Abstract
This invention provides a method of obtaining accurate measurements of polarization dependent loss and insertion loss during the tests aiming at measuring the polarization properties of optical components. This is achieved by taking into account every polarization disturbance in the line between generation of known states of polarization and the device under test. The method involves computing within a desired range of wavelengths either the transfer matrix of each polarization perturbing element or of all polarization perturbing elements as a whole, and compensating for errors introduced by these polarization perturbing elements.
Claims6
Method of obtaining accurate polarization dependent loss (PDL) and insertion loss (IL) measurement, taking into account every polarization disturbance having a transfer matrix in a line between generation of known states of polarization and a device under test (DUT), which comprises computing within a desired range of wavelengths the transfer matrix of each polarization perturbing element in the line between the generation of known states of polarization and the DUT using the following equation:
- └Sij out┘=└mij┘└Sij in┘
- in which └mij┘ is the transfer matrix of the DUT, └Sij out┘ is the output polarization matrix of each element, and └Sij in┘ is the matrix of input state of polarization of each element, and compensating for errors introduced along the line by said polarization perturbing elements by correcting the above equation as follows:
- └Sij out┘=└mij┘|perturbation1||perturbation2| . . . └Sij in┘
- wherein |perturbation1|, |perturbation2| . . . are transfer matrices of each polarization perturbing element, thereby obtaining an accurate measurement of the PDL and the IL of the DUT.
Method of obtaining accurate polarization dependent loss (PDL) and insertion loss (IL) measurement, taking into account every polarization disturbance having a transfer matrix in a line between generation of known states of polarization and a device under test (DUT), which comprises computing within a desired range of wavelengths, the transfer matrix of all polarization perturbing elements as a whole in the line between the generation of known states of polarization and the DUT, using the following formula:
- └Sij out┘=└mij┘└Sij out┘
- in which └mij┘ is the transfer matrix of the DUT, └Sij out┘ is the output polarization matrix of each element, and └Sij in┘ is the matrix of input state of polarization of each element, and compensating for errors introduced along the line by said polarization perturbing elements by correcting the above equation as follows:
- └Sij out┘=└mij┘[perturbations]└Sij in┘
- where [perturbations] is the matrix all the polarization perturbing elements taken as a whole, thereby obtaining an accurate measurement of the PDL and the IL of the DUT.
Dependencies are inferred from the claim text.