Back to results
US 6,888,367 B1Granted
Method and apparatus for testing integrated circuit core modules
AssigneeLSI Logic Corporation
InventorsThai M. Nguyen, James T. Ngo, William Shen
Life of this patent
Estimating the term…
Abstract
A method of testing a core module includes steps of: (a) providing a core module of an integrated circuit design; (b) connecting an end user input and a core module test input to separate I/O pins of the core module to isolate logic associated with an end user signal from that associated with a core module test signal; and (c) multiplexing the end user signal and the core module test signal in the core module in response to a core module test mode signal.
Claims20
A method of testing a core module comprising steps of:
- (a) providing a core module of an integrated circuit design;
- (b) connecting an end user input and a core module test input to separate I/O pins of the core module to isolate logic associated with an end user signal from that associated with a core module test signal;
- and
- (c) multiplexing the end user signal and the core module test signal in the core module in response to a core module test mode signal.
1 more element
An apparatus comprising:
- a core module of an integrated circuit;
- an end user input and a core module test input connected to separate I/O pins of the core module to isolate logic associated with an end user signal from that associated with a core module test signal;
- and
- a multiplexer for multiplexing the end user signal and the core module test signal in the core module in response to a core module test mode signal.
1 more element
Dependencies are inferred from the claim text.