Test system and test contactor for electronic modules
AssigneeMicron Technology, Inc.
InventorDaniel P. Cram
Life of this patent
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AssigneeMicron Technology, Inc.
InventorDaniel P. Cram
Estimating the term…
A pass through test system for testing an electronic module includes an interface board, and test contactors movably mounted to the interface board for electrically engaging terminal contacts on the module with a zero insertion force on the modules. The interface board is configured for mounting to an automated or manual pass through test handler in electrical communication with test circuitry. In a first embodiment the interface board includes test pads in electrical communication with the test circuitry, and rotatable test contactors having spring contacts configured to simultaneously engage the test pads and the terminal contacts on the module. In a second embodiment the interface board includes test pads in electrical communication with the test circuitry, and slidable test contactors having beam leads configured to simultaneously engage the test pads and the terminal contacts on the module. In a third embodiment the test contactors are slidably mounted to the interface board, and include coiled spring contacts in electrical communication with a flex circuit. A test method includes the steps of: providing the test contactors, electrically engaging the terminal contacts on the module with a zero insertion force using the test contactors, and then applying test signals through the test contactors and the terminal contacts to the module.
A system for testing an electronic module having a plurality of terminal contacts comprising:
A pass through test contactor for testing an electronic module having a plurality of terminal contacts comprising:
A test system for testing an electronic an electronic module having a plurality of terminal contacts comprising:
A system for testing an electronic module having a plurality of terminal contacts comprising:
Dependencies are inferred from the claim text.