High density logic analyzer probing system
AssigneeTektronix, Inc.
InventorDavid T. Engquist
Life of this patent
Estimating the term…
Abstract
A high density logic analyzer probing system has a probe mounting fixture for accurately positioning mounting posts to a device under test (DUT). The mounting posts includes a recess in one side for receiving a spring wire clip that mounts through holes in the DUT. The housing includes protrusions that receive screws for securing the probe head to the mounting posts on the DUT. The screws have a first shoulder that engages the protrusions and a second shoulder that engages the mounting post. The probe head is positioned between the mounting posts and tightened to the DUT using the screws. The first shoulder applies downward pressure on the probe head and the second shoulder provides a positive stop to prevent over tightening of the probe head which can cause damage to probe contacts in the probe head.
Claims3
A high density logic analyzer probing system for a device under test having opposing surfaces with one surface having a land pattern that includes electrically conductive contacts disposed between mounting holes formed in the device under test comprising:
- a removable probe mounting fixture having a handle and a mounting post alignment portion;
- mounting posts having a threaded aperture formed in a first surface thereof positioned adjacent to the ends of the mounting post alignment portions and held in place by downwardly extending studs in the handle portion engaging the threaded apertures in the mounting posts with one of the mounting posts having an alignment stud extending from a second surface opposite the first surface for engaging an alignment hole in the device under test;
- mounting post securing members engaging the mounting posts and positioned through and secured in the mounting holes in the device under test with the removable probe mounting fixture being removed from the mounting posts;
- a probe head having electrically conductive contacts disposed at one end of a housing engaging the electrically conductive contacts on the device under test with the housing having laterally extending protrusions formed on the opposite end of the housing for receiving mounting screws;
- and
- each mounting screw having a shaft and a threaded portion at one end and a integrally form cap at the other end forming a first shoulder on the shaft and a boss disposed between the threaded portion and the cap having a second shoulder;
- wherein the threaded portions of the screws engage the respective threaded aperture of the mounting posts with the first shoulder providing downward force on the probe against the device under test as the screws are tightened in the mounting posts and the second shoulder providing a positive stop for the probe head as the screws are tightened to prevent excess force between the probe head and the device under test.
Dependencies are inferred from the claim text.