Semiconductor device with alternating conductivity type layers having different vertical impurity concentration profiles
AssigneeKabushiki Kaisha Toshiba
InventorsWataru Saito, Ichiro Omura, Kozo Kinoshita
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Abstract
A power semiconductor device is disclosed, which comprises a semiconductor layer including a first semiconductor layer of a first conductivity type and a second semiconductor layer of a second conductivity type, which are periodically formed in the lateral direction, and a power semiconductor element including the semiconductor layers that are formed periodically, wherein a distribution of an amount of an impurity in a vertical direction of the first semiconductor layer differs from a distribution of an amount of an impurity in the vertical direction of the second semiconductor layer.
Claims3
A power semiconductor device comprising:
- a first semiconductor layer of a first conductivity type;
- a first main electrode electrically connected to the first semiconductor layer;
- second semiconductor layers of a second conductivity type formed within the first semiconductor layer and periodically arranged in a lateral direction, a profile of an amount of an impurity in a vertical direction of the second semiconductor layers being differ from a profile of an amount of the impurity in the vertical direction of the first semiconductor layer;
- a third semiconductor layer of the second conductivity type selectively formed in surfaces of the first semiconductor layer and the second semiconductor layer;
- a fourth semiconductor layer of the first conductivity type selectively formed in a surface of the third semiconductor layer;
- a second main electrode formed to be connected to the surface of the third semiconductor layer and a surface of the fourth semiconductor layer;
- and
- a control electrode formed on the first semiconductor layer, the third semiconductor layer and the fourth semiconductor layer with a gate insulating film interposed therebetween,
- wherein the first semiconductor layer has a constant concentration of the impurity in a vertical direction from the second main electrode to the first main electrode;
- and
- the second semiconductor layer has a concentration of the impurity distributed such that the impurity concentration is decreased in the vertical direction from the second main electrode to the first main electrode.
Dependencies are inferred from the claim text.