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US 6,888,129 B2Granted
Ion optics system for TOF mass spectrometer
AssigneeKratos Analytical Limited
InventorsAndrew R. Bowdler, Emmanuel Raptakis
Life of this patent
Estimating the term…
Abstract
A time of flight (TOF) mass spectrometer includes an ion source which has an extraction lens. The extraction lens has an element with an aperture. The aperture extends through the element to form a through-channel. In use, ions may pass from one side of the element to the opposite side of the element by passing through the through channel. The through channel has a length which is equal to or greater than {fraction (8/10)} of a diameter of the aperture.
Claims22
A time of flight mass spectrometer having:
- an ion source with a sample plate,
- a drift region,
- a light reflecting system including a support element having an aperture and at least one reflective element, and
- a light source for directing light onto the reflective element;
- the spectrometer being configured such that, in use, ions from the ion source pass through the support element's aperture and light from the light source incident on the reflective element is reflected along a path towards the sample plate and towards the axis of the support element's aperture;
- and characterized in that the reflective element is releasably connected to and detachable from said support element.
3 more elements
A time of flight mass spectrometer having:
- an ion source with a sample plate,
- a drift region,
- a light reflecting system including a support element having an aperture and at least one reflective element, and
- a light source for directing light onto the reflective element;
- the spectrometer being configured such that, in use, ions from the ion source pass through the support element's aperture and light from the light source incident on the reflective element is reflected along a path towards the sample plate and towards the axis of the support element's aperture;
- and characterized in that the reflective element is releasably connected to and detachable from said support element,
- wherein the reflective element is a prism formed of a conductive material or coated with a conductive material,
- wherein said support element has a plurality of reflective elements.
5 more elements
Dependencies are inferred from the claim text.