Method of manufacturing semiconductor pressure sensor
AssigneeDenso Corporation
InventorsTakashi Katsumata, Inao Toyoda
Life of this patent
Estimating the term…
Loading patent…
AssigneeDenso Corporation
InventorsTakashi Katsumata, Inao Toyoda
Estimating the term…
In a semiconductor pressure sensor manufacturing method of disposing an etching mask (50) at one-face (11) side of a monocrystal silicon substrate 10 in which the face-direction of the one face 11 corresponds to the (110)-face, and then carrying out anisotropic etching to form a recess portion (20) and a diaphragm (30) at the bottom surface side of the recess portion (20), the etching mask (51) is designed to have a cross-shaped opening portion (51) at which a first area extending along the <110> crystal axis direction and a second area extending along the <100> crystal axis direction cross each other, the area of the opening portion (51a) of the overlap area between the first and second areas in the opening portion (51) being set to be smaller than the area of the diaphragm (30).
A method of manufacturing a semiconductor pressure sensor on a monocrystal silicon substrate in which the face direction of one face corresponds to the (110)-face, the method comprising:
A method for manufacturing a semiconductor pressure sensor on a monocrystal semiconductor substrate, the method comprising:
A method of manufacturing a semiconductor pressure sensor on a monocrystal silicon substrate in which the face direction of one face corresponds to the (110) -face, method comprising:
Dependencies are inferred from the claim text.