Apparatuses and methods for conditioning polishing pads used in polishing micro-device workpieces
AssigneeMicron Technology, Inc.
InventorSuresh Ramarajan
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AssigneeMicron Technology, Inc.
InventorSuresh Ramarajan
Estimating the term…
Apparatuses and methods for conditioning polishing pads used in polishing micro-device workpieces are disclosed herein. In one embodiment, an end effector for conditioning a polishing pad includes a member having a first surface and a plurality of contact elements projecting from the first surface. The member also includes a plurality of apertures configured to flow conditioning solution to the polishing pad. The apertures can extend from the first surface to a second surface opposite the first surface. The member can further include a manifold that is in fluid communication with the apertures. In another embodiment, a conditioner for conditioning the polishing pad includes an arm having at least one spray nozzle configured to spray conditioning solution onto the polishing pad and an end effector coupled to the arm. The end effector includes a first surface and a plurality of contact elements projecting from the first surface.
An end effector for conditioning a polishing pad used in polishing a micro-device workpiece, the end effector comprising:
An end effector for conditioning a polishing pad used in polishing a micro-device workpiece, the end effector comprising:
An apparatus for conditioning a polishing pad used in polishing a micro-device workpiece, comprising:
An apparatus for conditioning a polishing pad used in polishing micro-device workpieces, the apparatus comprising:
An end effector for conditioning a polishing pad used in polishing a micro-device workpiece, the end effector comprising a generally planar surface, a plurality of apertures in the surface positioned to flow a conditioning solution onto the polishing pad, and a plurality of diamond articles embedded in the surface wherein at least a portion of the diamond particles project from the surface and are configured to abrade the polishing pad, wherein the apertures comprise a plurality of first apertures in a first region of the surface and a plurality of second apertures in a second region of the surface, wherein the plurality of first apertures is configured to provide a first volume of conditioning solution to the polishing pad, wherein the plurality of second apertures is configured to provide a second volume of conditioning solution to the polishing pad, the second volume being different than the first volume.
Dependencies are inferred from the claim text.