Independently controlled read and write head stripe height parameters in slider back end process

A method of lapping a row of magnetic read/write heads formed on a substrate, said lapping forms an ABS plane, comprising:

• (a) correlating the resistance RRE of a first electrical lapping guide (ELG) formed on a first plane and along a lapping plane in a read head to the resistance RWE of a second ELG and to the width of a first optical lapping guide (OLG) having a triangular shape wherein said second ELG and first OLG are formed along the lapping plane in an adjacent write head;
• and
• (b) lapping said row of magnetic read/write heads until a RRE resistance value corresponding to an acceptable stripe height of a sensor is reached and until a RWE
• resistance value corresponding to an acceptable critical dimension in the write head is reached.

A method of lapping a row of magnetic read/write heads formed on a substrate, said lapping forms an ABS plane, comprising:

• (a) correlating the resistance RRE of a first electrical lapping guide (ELG) formed on a first plane along a lapping plane in a read head to the resistance RWE of a second ELG and to the width of a first optical lapping guide (OLG) formed along the lapping plane in an adjacent write head on a test row on said substrate to determine target values for RRE and RWE;
• (b) adjusting the tilt of the lapping plane by a controller that has target values for stripe height of a sensor in the read head and for critical dimensions perpendicular to the lapping plane in the write head while lapping a row on said substrate;
• and
• (c) lapping said row until a RRE resistance corresponding to an acceptable stripe height is reached and until a RWE resistance corresponding to an acceptable critical dimension in the write head is reached.