Micro connector to facilitate testing of micro electronic component and subassemblies
AssigneePemstar, Inc.
InventorsDaniel Johns, Thomas Myhre, Sr., Jeffrey Hames
Life of this patent
Estimating the term…
Abstract
The present invention is a testing apparatus which includes a contact connector comprised of a housing with contact blades extending from the housing. The contact blades are pivotally mounted to the housing by pivot rods. A biasing element is coupled to the contact blades, providing resistance against rotary movement of the contact blade in one direction. In one embodiment, the housing has a comb structure including a plurality of slots and slot division walls between the slots. A spacer is disposed in each of the slots, and the contact blades are aligned with the slot division walls.
Claims10
A connector comprising:
- a housing having a comb structure;
- a plurality of contact blades pivotally disposed within the comb structure of the housing, each of the contact blades comprising a disengageable contact portion;
- a biasing element in contact with each of the contact blades at end of each of the contact blades opposite the disengageable contact portion and opposing pivotal movement of the contact blades in one direction, wherein the biasing element is a flexible pin;
- and
- an output pin conductively coupled to the flexible pin.
A connector, comprising:
- a housing having a comb structure, wherein the comb structure includes a plurality of slots and slot division walls between the slots;
- a plurality of contact blades pivotally disposed within the comb structure of the housing, each of the contact blades comprising a disengageable contact portion;
- and
- a biasing element in contact with each of the contact blades at an end of each of the contact blades opposite the disengageable contact portion and opposing pivotal movement of the contact blades in one direction.
Dependencies are inferred from the claim text.