Method of disposing conductive bumps onto a semiconductor device
AssigneeMicron Technology, Inc.
InventorsMichael B. Ball, Chad A. Cobbley
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AssigneeMicron Technology, Inc.
InventorsMichael B. Ball, Chad A. Cobbley
Estimating the term…
A method of forming conductive structures on the contact pads of a substrate,such as a semiconductor die or a printed circuit board. A solder mask is secured to an active surface of the substrate. Apertures through the solder mask are aligned with contact pads on the substrate. The apertures may be preformed or formed after a layer of the material of which the solder mask is comprised has been disposed on the substrate. Conductive material is disposed in and shaped by the apertures of the solder mask to form conductive structures in communication with the contact pads exposed to the apertures. Sides of the conductive structures are exposed through the solder mask, either by removing the solder mask from the substrate or by reducing the thickness of the solder mask. The present invention also includes semiconductor devices formed during different stages of the method of the present invention.
A method of disposing a conductive structure on at least one contact pad on an active surface of a semiconductor device substrate, comprising:
A method of forming a solder mask, comprising:
A method of exposing at least a portion of a lateral periphery of a conductive structure on a semiconductor device, comprising partially reducing a thickness of a solder mask that comprises polymeric material disposed around said lateral periphery.
A method of exposing a conductive structure that protrudes from a surface of a semiconductor device through a solder mask that comprises a polymeric material positioned on the surface of the semiconductor device, comprising:
Dependencies are inferred from the claim text.