Programmable embedded DRAM current monitor
AssigneeMicron Technology, Inc.
InventorJoseph M. Jeddeloh
Life of this patent
Estimating the term…
Loading patent…
AssigneeMicron Technology, Inc.
InventorJoseph M. Jeddeloh
Estimating the term…
This invention provides a method and apparatus for controlling the current drawn in a multi-bank memory device, for example, in a multi-bank memory system. The above and other features and advantages of the invention are achieved by a method and apparatus which controls access to a memory device to prevent an over-current condition. Each memory request is processed for each memory bank as an arbitrated event. A request is coordinated with the local memory controller circuitry controlling access to the memory bank. The memory bank is checked for its availability. The total current demand of the memory device is determined. If the memory bank request would not create an over-current condition and the memory bank is available, then the memory bank request is acknowledged and the memory request is carried out. Also provided is a method of fabricating such a memory device and also a method of operating such a memory device to access a selected memory bank.
A device for controlling over current conditions in a semiconductor memory circuit, comprising:
A device for preventing over current conditions in a memory circuit, comprising:
A method for controlling an over-current condition in a memory array, the method comprising:
A semiconductor memory chip, comprising
A processor system, comprising:
Dependencies are inferred from the claim text.