A semiconductor radiation imaging device for imaging high-energy radiation, comprising an array of pixel cells including an array of pixel detectors which directly generate charge in response to incident radiation and a corresponding array of individually addressable pixel circuits, wherein each pixel circuit is associated with a respective pixel detector for accumulating charge directly resulting from radiation incident on said pixel detector and comprises threshold circuitry and charge accumulation circuitry, said threshold circuitry being configured to discard radiation hits on said pixel detector below a predetermined threshold and said charge accumulation circuitry being configured to accumulate charge directly resulting from a plurality of successive radiation hits on said respective pixel detector at or above said predetermined threshold.