Versatile system for high resolution device calibration
AssigneeTexas Instruments Incorporated
InventorsPaul H. Fontaine, Abdellatif Bellaouar
Life of this patent
Estimating the term…
Loading patent…
AssigneeTexas Instruments Incorporated
InventorsPaul H. Fontaine, Abdellatif Bellaouar
Estimating the term…
The present invention provides a system for providing high-resolution calibration of a programmable semiconductor component (518). The system calibrates the programmable semiconductor component, within a desired accuracy, to a goal value (802). The system provides a primary DAC function (510) and a supplemental DAC function (512), as well as a control function (506). The control function is utilized to determine a first bit step (806) of the primary DAC function that corresponds to the goal value. The control function then determines a second bit step (810) of the supplemental DAC function that corresponds to the goal value. The bit codes of the first and second bit steps are combined by a summing function (514), to provide a programming control word for the programmable semiconductor component.
A semiconductor device comprising:
A method of providing high-resolution calibration of a programmable semiconductor component, the method comprising the steps of:
Dependencies are inferred from the claim text.