Comparator circuit for semiconductor test system
AssigneeAdvantest Corporation
InventorsJames W. Frame, Richard W. Chrusciel
Life of this patent
Estimating the term…
Abstract
A comparator circuit for use in a semiconductor test system for comparing differential output signals of a semiconductor device under test (DUT). The comparator circuit is formed of a first pair of comparators having a DC comparator and an AC comparator which receives a first differential signal, a second pair of comparators having a DC comparator and an AC comparator which receives a second differential signal, a first latch for latching output of the first pair of comparators, a second latch for latching output of the second pair of comparators, and first and second serial-parallel converters for converting output signals of the first and second latches into parallel signals. The comparator circuit is formed of discrete components on a dielectric substrate.
Claims12
A comparator circuit for a semiconductor test system for differential signals that are output from a device under test (DUT), comprising:
- a first pair of comparators having a DC comparator and an AC comparator which receives a first differential signal from the DUT;
- a second pair of comparators having a DC comparator and an AC comparator which receives a second differential signal from the DUT;
- a first latch circuit for latching output signals of the first pair of comparators at timings specified by strobe signals;
- a second latch circuit for latching output signals of the second pair of comparators at timings specified by strobe signals;
- a first serial-parallel converter for converting an output signal of the first latch circuit into a parallel signal;
- and
- a second serial-parallel converter for converting an output signal of the second latch circuit into a parallel signal;
- wherein the comparator circuit is formed of discrete components on a dielectric substrate.
An active card for a semiconductor test system for testing a semiconductor device under test (DUT) comprising:
- a differential comparator circuit for comparing differential signals that are output from the DUT, comprising:
- a first pair of comparators having a DC comparator and an AC comparator which receives a first differential signal from the DUT;
- a second pair of comparators having a DC comparator and an AC comparator which receives a second differential signal from the DUT;
- a first latch circuit for latching output signals of the first pair of comparators at timings specified by strobe signals;
- a second latch circuit for latching output signals of the second pair of comparators at timings specified by strobe signals;
- a first serial-parallel converter for converting an output signal of the first latch circuit into a parallel signal;
- and
- a second serial-parallel converter for converting an output signal of the second latch circuit into a parallel signal;
- a dielectric substrate for mounting discrete components on a surface thereof for establishing the differential comparator circuit;
- wherein the active card having the differential comparator circuit is mounted in a test fixture of the semiconductor test system where the test fixture is located between the DUT and a pin electronics of the semiconductor test system for establishing electrical connection therebetween.
Dependencies are inferred from the claim text.