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US 6,856,129 B2Granted
Current probe device having an integrated amplifier
AssigneeIntel Corporation
InventorsThomas P. Thomas, Douglas N. Stunkard, Miriam R. Reshotko, Brandon C. Barnett, Ian A. Young
Life of this patent
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Abstract
A measurement system is provided that includes a probe device having an integrated amplifier. The integrated amplifier may be a transimpedence amplifier that amplifies input current to an output voltage.
Claims26
A probe apparatus comprising:
- a first probe tip for contacting a device under test (DUT);
- a second probe tip for contacting the DUT;
- an integrated transimpedance amplifier coupled to the first probe tip and the second probe tip.
A device comprising:
- a probe for contacting a device under test (DUT) having a first and second probe tip;
- and
- a bias T component coupled to at least the first probe tip and an integrated transimpedance amplifier.
A method comprising:
- contacting a device under test (DUT) with a first probe having a first and a second probe tip coupled to an integrated transimpedance amplifer;
- sensing a current signal on the DUT;
- amplifying the current signal with the integrated transimpedance amplifier;
- and
- outputting a voltage signal from the transimpedance amplifier based on the current signal.
2 more elements
A system comprising:
- a probe having a first and a second probe tip for contacting a device under test (DUT) and an integrated transimpedance amplifier, wherein the first probe tip is coupled to the transimpedance amplifier through a bias T component;
- a transmission line with a first and a second end, wherein the first end of the transmission line is coupled to an output of the transimpedance amplifier;
- and
- a measurement device coupled to the second end of the transmission line.
1 more element
Dependencies are inferred from the claim text.