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US 6,856,126 B2Granted
Differential voltage probe
AssigneeAgilent Technologies, Inc.
InventorsMichael T. McTigue, Kenneth Rush, Bob Kimura, Michael J. Lujan
Life of this patent
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AssigneeAgilent Technologies, Inc.
InventorsMichael T. McTigue, Kenneth Rush, Bob Kimura, Michael J. Lujan
Estimating the term…
A voltage probe includes a first signal lead configured to receive a first signal from a device under test, a first probe-tip network that is coupled to the first signal lead and that has a frequency response that includes a first transmission zero, a first compensation network that is coupled to the first probe-tip network and that has a frequency response that includes a first transmission pole, a second signal lead configured to receive a second signal from the device under test, a second probe-tip network that is coupled to the second signal lead and that has a frequency response that includes a second transmission zero, a second compensation network that is coupled to the second probe-tip network and that has a frequency response that includes a second transmission pole, and a differential amplifier circuit that is coupled to the first compensation network and to the second compensation network, and that is configured to provide a third signal that is responsive to the first signal and to the second signal. Methods and other systems for providing electrical connections to devices under test are disclosed.
A method for providing signals to a measuring instrument, the method comprising:
A voltage probe comprising:
A system for providing signals to a measuring instrument, the system comprising:
Dependencies are inferred from the claim text.