Calibration of integrated circuit time constants
AssigneeCypress Semiconductor Corporation
InventorsMark Richard Gehring, Brent R. Jensen
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AssigneeCypress Semiconductor Corporation
InventorsMark Richard Gehring, Brent R. Jensen
Estimating the term…
A method and system for calibrating a time constant within an integrated circuit. A voltage storage element is charged, and the time required to achieve a reference voltage on the storage element is measured. The measured time is compared to a desired time. It necessary, an adjustable impedance is modified to change the charging time, and the cycle may be repeated until the charging time matches the desired time. In this novel manner, an actual RC time constant, as rendered in a particular integrated circuit, is measured and potentially adjusted to match a desired time constant. Advantageously, configuration information of the adjustable impedance may be communicated to other circuitry within the integrated circuit to enable such circuitry to implement the same RC time constant in analog signal processing. Consequently, embodiments of the present invention overcome incidences of wide tolerance in passive components implemented in integrated circuits. Beneficially, no external test equipment is required.
A method of calibrating an integrated circuit time constant comprising:
An electronic circuit for calibrating a time constant comprising:
In an electronic circuit, a method of calibrating a time constant comprising:
Dependencies are inferred from the claim text.