Method and apparatus for batch processing of wafers in a furnace
AssigneeASM International N.V.
InventorsJannes Remco van den Berg, Edwin den Hartog
Life of this patent
Estimating the term…
Loading patent…
AssigneeASM International N.V.
InventorsJannes Remco van den Berg, Edwin den Hartog
Estimating the term…
A method and apparatus for batch processing of semiconductor wafers in a furnace advantageously allow for wafers to be supported for processing at very high temperatures (e.g., about 1350° C.). Each wafer is supported during processing by a wafer support with full perimeter support, such as a ring or plate. The wafers, on their supports, are removable and vertically spaced apart in a wafer support holder. A transfer station is provided wherein, during loading, a wafer is placed on a wafer support and, during unloading, the wafer is separated from the wafer support. A FOUP (Front Opening Unified Pod) is adapted to accommodate a plurality of wafer supports and to accommodate the transfer station. The wafer support, with a wafer supported on it, is transferred from the transfer station to a wafer support holder for processing.
A method for semiconductor processing, comprising:
A method for semiconductor processing, comprising:
A system for processing a substrate, comprising:
A semiconductor wafer cassette, wherein interior of the wafer cassette comprises:
Dependencies are inferred from the claim text.