Semiconductor manufacturing method, substrate processing method, and semiconductor manufacturing apparatus
AssigneeHitachi Kokusai Electric Inc.
InventorSatoshi Takano
Life of this patent
Estimating the term…
Loading patent…
AssigneeHitachi Kokusai Electric Inc.
InventorSatoshi Takano
Estimating the term…
It is an object of the present invention to adjust the transfer environment of a substrate in order to prevent contamination of the substrate surface by impurities. A semiconductor manufacturing apparatus comprises a load-lock chamber 1 in which substrate exchange with the outside is performed, a wafer process chamber 2 in which the wafer is subjected to a predetermined processing, and a transfer chamber 3 in which the wafer is transferred between the load-lock chamber 1 and the wafer process chamber 2. In a semiconductor manufacturing method in which this semiconductor manufacturing apparatus is used to treat a substrate, an inert gas (N2) is supplied to and exhausted from the load-lock chamber 1, the transfer chamber 3, and the wafer process chamber 2 while the substrate is being transferred from the load-lock chamber 1 to the wafer process chamber 2 through the transfer chamber 3, and the substrate transfer is carried out with a predetermined pressure maintained.
A semiconductor manufacturing method, comprising:
A semiconductor manufacturing method, comprising the steps of:
A semiconductor manufacturing method, comprising the steps of:
A substrate processing method, comprising:
A semiconductor manufacturing method, comprising the steps of:
A semiconductor manufacturing method, comprising the steps of:
A semiconductor manufacturing method, comprising the steps of:
Dependencies are inferred from the claim text.