Interconnect for microelectronic structures with enhanced spring characteristics
AssigneeFormFactor, Inc.
InventorsGaetan L. Mathieu, Benjamin N. Eldridge
Life of this patent
Estimating the term…
Loading patent…
AssigneeFormFactor, Inc.
InventorsGaetan L. Mathieu, Benjamin N. Eldridge
Estimating the term…
An interconnection element and a method of forming an interconnection element. In one embodiment, the interconnection element includes a first structure and a second structure coupled to the first structure. The second structure coupled with the first material has a spring constant greater than the spring constant of the first structure alone. In one embodiment, the interconnection element is adapted to be coupled to an electronic component tracked as a conductive path from the electronic component. In one embodiment, the method includes forming a first (interconnection) structure coupled to a substrate to define a shape suitable as an interconnection in an integrated circuit environment and then coupling, such as by coating, a second (interconnection) structure to the first (interconnection) structure to form an interconnection element. Collectively, the first (interconnection) structure and the second (interconnection) structure have a spring constant greater than a spring constant of the first (interconnection) structure.
A resilient electronic interconnection element comprising:
An interconnection element comprising:
Dependencies are inferred from the claim text.