Loading patent…
AssigneeJfe Steel Corporation
InventorsToru Fujimura, Akira Yamamoto
Estimating the term…
A method and apparatus for quantitatively measuring a metal phase contained in a galvanized layer by X-ray diffractometry, and a method of producing a galvanized steel sheet by using the method and apparatus. The diffracted X-ray intensity from a metal phase contained in the galvanized layer is increased to improve measurement accuracy, thereby permitting application to on-line measurement. The diffracted X-rays from the metal phase are measured over a predetermined range on a Debye ring, or measured at a plurality of positions on the Debye ring to increase the diffracted X-ray intensity, thereby improving measurement accuracy. The X-ray beam produced by an X-ray source is compressed and made parallel and monochromatic by a multilayer film mirror to increase diffracted X-ray intensity, improving measurement accuracy. Particularly, the present invention is applied to measurement of the degree of alloying of hot-dip galvanization.
A method of measuring the deposit amount of a metal phase contained in a galvanized layer by using X-ray diffractometry, the method comprising measuring diffracted X-rays from the metal phase contained in the galvanized layer over a predetermined range on a Debye ring, and integrating the obtained X-ray diffraction intensity data, wherein, prior to the step of measuring the diffracted X-rays, the method comprises a further step of limiting the diffracted X-rays being measured to those diffracted X-rays passing through a slit corresponding to a portion of a circumference of the Debye ring.
A method of measuring the deposit amount of a metal phase contained in a galvanized layer by using X-ray diffractometry, the method comprising measuring diffracted X-rays from the metal phase contained in the galvanized layer over a predetermined range on a Debye ring, and integrating the obtained X-ray diffraction intensity data, wherein,
Dependencies are inferred from the claim text.