Silicoaluminophosphate molecular sieve
AssigneeExxonMobil Chemical Patents Inc.
InventorsMarcel J. G. Janssen, An Verberckmoes, Machteld M. Mertens, Antonie Jan Bons, Wilfried J. Mortier
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Abstract
The present invention relates to a silicoaluminophosphate molecular sieve comprising at least one intergrown phase of molecular sieves having AEI and CHA framework types, wherein said intergrown phase has an AEI/CHA ratio of from about 5/95 to 40/60 as determined by DIFFaX analysis, using the powder X-ray diffraction pattern of a calcined sample of said silicoaluminophosphate molecular sieve. It also relates to methods for its preparation and to its use in the catalytic conversion of methanol to olefins.
Claims31
A silicoaluminophosphate molecular sieve comprising at least one intergrown phase of molecular sieves having AEI and CHA frameworks, wherein said intergrown phase has an AEI/CHA ratio of from about 5/95 to 40/60 as determined by DIFFaX analysis and having at least one reflection peak in the 17.7 to 18.1 (2θ) range, using the powder X-ray diffraction pattern of a calcined sample of said silicoaluminophosphate molecular sieve.
A process for making an olefin product from an oxygenate feedstock comprising contacting said oxygenate feedstock with a catalyst comprising a silicoaluminophosphate molecular sieve comprising at least one intergrown phase of molecular sieves having AEI and CHA frameworks, wherein said intergrown phase has an AEI/CHA ratio of from about 5/95 to 40/60 as determined by DIFFaX analysis and has at least one reflection peak in the 17.7 to 18.1 (2θ) range, using the powder X-ray diffraction pattern of a calcined sample of said silicoaluminophosphate molecular sieve, under conditions effective to form an olefin product.
A silicoaluminophosphate molecular sieve exhibiting an X-ray diffraction pattern having at least one reflection peak in each of the following ranges in the 5 to 25 (2θ) range:
- 2θ (CuKα) 9.3-9.6 12.7-13.0 13.8-14.0 15.9-16.1 17.7-18.1 18.9-19.1 20.5-20.7 23.7-24.0
- and having no reflection peak in the 9.8 to 12.0 (2θ) range and no broad feature centered at about 16.9 (2θ).
Dependencies are inferred from the claim text.