Semiconductor device suitable for system in package
AssigneeRenesas Technology Corp.
InventorShigeki Tomishima
Life of this patent
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Abstract
In each of output buffer circuits arranged corresponding to respective output pads, a first output buffer having small current driving capability for a normal operation mode and a second output buffer having large current driving capability for a test operation mode are arranged in parallel with each other. One of the first and second output buffers is enabled and the other is set to an output high impedance state alternatively in accordance with a mode designating signal. Thus, an output buffer circuit capable of driving an output pad with optimal driving capabilities in a normal operation mode and in a test operation mode in a semiconductor device for use in a system in package is implemented.
Claims15
A semiconductor device, comprising:
- a first output buffer coupled to an output pad, enabled in a normal operation mode and set to an output high impedance state in a test operation mode, for driving said output pad with first driving capability in accordance with an internal signal when enabled;
- and
- a second output buffer coupled to said output pad, enabled in said test operation mode and set to an output high impedance state in said normal operation mode, for driving said output pad with a second driving capability greater than said first driving capability in accordance with said internal signal when enabled.
A semiconductor device, comprising:
- an output buffer coupled to an output pad and driving said output pad in accordance with an internal signal, said output buffer including an insulated gate type output transistor driving said output pad in accordance with said internal signal;
- and
- a back gate voltage setting circuit for changing a voltage of a back gate of the output transistor in accordance with an operation mode, said back gate voltage setting circuit setting a voltage level of said back gate such that driving capability of said output transistior becomes greater in said operation mode being a test mode than in said operation mode being a normal operation mode.
Dependencies are inferred from the claim text.