Interferometric cyclic error compensation
AssigneeZygo Corporation
InventorHenry A. Hill
Life of this patent
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Abstract
The invention features an interferometry method including: directing two beams derived from a common source along different paths; producing a first output beam derived from a first portion of each of the two beams; producing a second output beam derived from a second portion of each of the two beams; and calculating a product of a first signal derived from the first output beam and a second signal derived from the second output beam.
Claims60
A method comprising:
- directing two beams derived from a common source along different paths;
- producing a first output beam derived from a first portion of each of the two beams;
- producing a second output beam derived from a second portion of each of the two beams;
- and
- calculating a product of a first signal derived from the first output beam and a second signal derived from the second output beam.
A method for reducing cyclic error contributions in an interferometry measurement, the method comprising:
- directing two beams derived from a common source along different paths in an interferometer, wherein the two beams have orthogonal polarizations and frequencies that differ by a heterodyne frequency;
- producing a first output beam derived from a portion of each of the two beams having a first common polarization;
- producing a second output beam derived from a portion of each of the two beams having a second common polarization substantially orthogonal to the first common polarization;
- generating first and second signals derived from intensity measurements of the first and second output beams, respectively;
- calculating a superheterodyne signal corresponding to a product of the first and second signals to substantially eliminate at least some first-order cyclic errors present in the first and second signals;
- and
- extracting the phase of the superheterodyne signal to provide information related to the different paths in the interferometer.
An apparatus comprising:
- an interferometer configured to direct two beams derived from a common source along different paths and produce a first output beam derived from a first portion of each of the two beams and a second output beam derived from a second portion of each of the two beams;
- first and second detectors positioned to measure an intensity of the first and second output beams, respectively;
- and
- an electronic processor coupled to the first and second detectors, wherein during operation the electronic processor calculates a product of a first signal derived from the intensity of the first output beam and a second signal derived from the intensity of the second output beam.
The apparatus of claim 44, wherein the information corresponds to a change in position of an object in one of the different paths.
The apparatus of claim 44, wherein the interferometer is configured to derive the two beams from an input beam, and wherein the information extracted by the electronic processor corresponds to an angular deviation of the input beam.
Dependencies are inferred from the claim text.