End-surface reflection type surface acoustic wave filter
AssigneeMurata Manfacturing Co., Ltd.
InventorsMichio Kadota, Hideya Horiuchi, Junya Ago, Takeshi Nakao, Yasuhiro Kuratani
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AssigneeMurata Manfacturing Co., Ltd.
InventorsMichio Kadota, Hideya Horiuchi, Junya Ago, Takeshi Nakao, Yasuhiro Kuratani
Estimating the term…
An end-surface reflection type surface acoustic wave filter is capable of increasing an attenuation amount outside a pass band while insertion loss characteristics are not seriously deteriorated. The filter is a longitudinally coupled resonator type surface acoustic wave filter using an SH type surface acoustic wave, which has first and second grooves formed in a piezoelectric substrate at the top surface thereof so as to be substantially parallel to each other and spaced from each other by a predetermined distance. In addition, IDTs which are provided between the grooves for defining the longitudinally coupled resonator type surface acoustic wave filter, reflection end-surfaces disposed on side surfaces of the first and the second grooves at the IDT sides, and one of a resin-coating layer and a protective layer made of SiO2, are provided on the top surface of the piezoelectric substrate. The resin-coating layer is arranged to cover at least a region at which the IDTs are located and at least one of the first and the second grooves so as to intrude into one of them, and the protective layer is arranged so as to cover the IDTs.
An end-surface reflection type surface acoustic wave filter comprising:
An end-surface reflection type surface acoustic wave filter according to claim wherein, when a wavelength of a surface acoustic wave which is to be used is represented by λ, and an electrode thickness of the interdigital transducer is represented by H H/λ≦0.045 is satisfied.
Dependencies are inferred from the claim text.