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US 6,806,724 B2Granted
Probe for combined signals
AssigneeCascaded Microtech, Inc.
InventorsLeonard Hayden, Scott Rumbaugh, Mike Andrews
Life of this patent
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Abstract
A direct current and a modulation signal are simultaneously applied to contact pads on a wafer to test certain devices, such as a laser diode. A probe, probing system, and method of probing reduces signal distortion and power dissipation by transmitting a modulated signal to the device-under-test through an impedance matching resistor and transmitting of a direct current to the device-under-test over a signal path that avoids the impedance matching resistor.
Claims8
A probe assembly comprising:
- (a) a conductive signal contact tip, said signal contact tip arranged for selective engagement with a signal contact pad of a device-under-test;
- (b) a first signal input port;
- (c) a resistor having a first port connected to said signal contact tip and a second port connected to said first signal input port;
- and
- (d) a second signal input port conductively connected to said signal contact tip.
2 more elements
A probe assembly comprising:
- (a) a conductive first signal contact tip, said first signal contact tip arranged for selective engagement with a signal contact pad of a device-under-test;
- (b) a first signal input port;
- (c) a resistor having a first port connected to said first signal contact tip and a second port connected to said first signal input port;
- (d) a conductive second signal contact tip, said second signal contact tip arranged for engagement with said signal contact pad of said device-under-test when said first signal contact tip is engaged with said signal contact pad;
- and
- (e) a second signal input port conductively connected to said second signal contact tip.
3 more elements
A method of testing a device-under-test, said method comprising the steps of:
- (a) engaging a signal contact pad of said device-under-test with a signal contact tip of a probe testing apparatus;
- (b) connecting a first port of an impedance matching resistor to said signal contact tip;
- (c) conducting a direct current to said signal contact tip;
- and
- (d) conducting a modulation signal to a second port of said impedance matching resistor.
2 more elements
Dependencies are inferred from the claim text.