Quantifying a difference between nodal voltages
AssigneeSun Microsystems, Inc.
InventorsClaude Gauthier, Brian Amick, Spencer Gold, Dean Liu, Kamran Zarrineh, Pradeep Trivedi
Life of this patent
Estimating the term…
Loading patent…
AssigneeSun Microsystems, Inc.
InventorsClaude Gauthier, Brian Amick, Spencer Gold, Dean Liu, Kamran Zarrineh, Pradeep Trivedi
Estimating the term…
A method and apparatus that uses the difference between two nodal voltages, such as a temperature-independent voltage and a temperature-dependent voltage, to determine the actual temperature at a point on an integrated circuit is provided. Further, a method and apparatus that converts a difference between nodal voltages in an integrated circuit from an analog to a digital quantity on the integrated circuit such that the difference in voltage may be used by an on-chip digital system is provided. Further, a method and apparatus for quantifying a difference in voltage between a first node and a second node of a temperature sensor is provided.
An apparatus for quantifying a difference in voltage between a first node and a second node, comprising:
An apparatus for quantifying a difference in voltage between a first node and a second node, comprising:
A method for quantifying a difference in voltage between a first node and a second node, comprising:
Dependencies are inferred from the claim text.