Electronic device, method for driving the electronic device, electro-optical device, and electronic equipment

An electronic device usable with a tester, comprising:

• a plurality of unit circuits, each of the unit circuits including:
• a first transistors;
• a holding element to hold an electrical signal, supplied through the first transistor, as an amount of electricity;
• a second transistor having a conduction state that is controlled in accordance with the amount of electricity held by the holding element;
• and
• a driven element which is supplied with an amount of current responsive to the conduction state;
• the second transistor being connected in series with the first transistor;
• and
• the electronic device being connectable through the first transistor to the tester which detects the amount of current.

An electro-optical device for use with a tester, comprising

• a plurality of scanning lines;
• a plurality of data lines;
• and
• a plurality of pixel circuits, each pixel circuit being arranged at an intersection of each of the plurality of scanning lines and each of the plurality of data lines, each
• pixel circuit including:
• a first transistor having a conduction that is controlled by a scanning signal supplied through a corresponding scanning line of the plurality of scanning lines;
• a holding element which holds, as an amount of electricity, a data signal supplied through a corresponding data line of the plurality of data lines and the first transistor;
• a second transistor having a conduction state that is controlled by the amount of electricity held by the holding element,
• an electro-optical element supplied with an amount of current responsive to the conduction state;
• and
• a third transistor connected in series with the second transistor,
• each of the plurality of pixel circuits being connected through the third transistor to the tester which detects the amount of current.

An electro-optical device for use with a tester comprising:

• a plurality of scanning lines;
• a plurality of data lines;
• and
• a plurality of pixel circuits, each pixel circuit being arranged at an intersection of each of the plurality of scanning lines and each of the plurality of data lines,
• the pixel circuit including:
• a first transistor having a conduction that is controlled by a scanning signal supplied through a corresponding scanning line of the plurality of scanning lines;
• a holding element which holds, as an amount of electricity, a data signal supplied through a corresponding data line of the plurality of data lines and the first transistor;
• a second transistor having a conduction state that is controlled by the amount of electricity held by the holding element, the second transistor being connected in series with the first transistor;
• and
• an electro-optical element supplied with an amount of current responsive to the conduction state;
• each of the plurality of pixel circuits being connected through the first transistor to the tester which detects the amount of current.