Program conversion system

#1. Field of the Invention

#The present invention relates to a system for converting a test program for a semiconductor integrated circuit.

#2. Background Art

#The present invention will be more apparent from the following detailed description, when taken in conjunction with the accompanying drawings, in which;

#FIGS. 1A and 1B schematically show two kinds of test environments;

#FIGS. 2A-2C show examples of signal waveforms on transmission lines;

#A program conversion method and system according to the invention will be hereinafter described with reference to the accompanying drawings.

#FIG. 1A schematically shows a transmission line from an LSI 1 to be tested that is set on a test board 4 to a pin electronics unit 3 of a tester 2. In FIG. 1A, point C0 is a connecting point between the LSI 1 and the test board 4 such as a DUT board and point C1 is a connecting point between the test board 4 and the pin electronics unit 3 of the tester 2. Each of the internal impedance of the LSI 1, the internal impedance of the tester 2, and the impedance of the test board 4 is equal to 100 Ω.

#FIG. 1B schematically shows how the same LSI 1 as shown in FIG. 1A and a test board 7 and a tester 5 that are different from the test board 4 and the tester 2 shown in FIG. 1A are connected to each other. In FIG. 1B, point C0 is a connecting point between the LSI 1 and the test board 7 and point C2 is a connecting point between the test board 7 and a pin electronics unit 6 of the tester 5. The internal impedance of the tester 5 is equal to 50 Ω and the impedance of the test board 7 is equal to 100 Ω.