Sorting a group of integrated circuit devices for those devices requiring special testing

An inspection process for integrated circuit devices from semiconductor wafers in a manufacturing process for integrated circuit devices, the inspection process comprising:

• providing a plurality of semiconductor wafers;
• fabricating a plurality of integrated circuit devices on each of the semiconductor wafers;
• causing each of the integrated circuit devices on each of the semiconductor wafers to store an individual identification code;
• separating each of the integrated circuit devices on each of the semiconductor wafers to form one of a plurality of integrated circuit devices;
• storing data in association with the individual identification code associated with each of the integrated circuit devices that indicates each of the integrated circuit devices to undergo one of a first process and a second process, storing of data including storing an individual identification code by programming each of the integrated circuit devices on each of the semiconductor wafers to permanently store a unique fuse identification;
• reading the individual identification code associated with each of the separated integrated circuit devices;
• accessing the data stored in association with the individual identification code that is associated with each of the separated integrated circuit devices;
• grouping the integrated circuit devices in accordance with the accessed data into those integrated circuit devices to undergo the first process and those integrated circuit devices to undergo the second process;
• and
• testing the grouped integrated circuit devices using the first process and the second process.

An integrated circuit manufacturing process for separating integrated circuit devices to undergo special testing from a group of integrated circuit devices undergoing standard test procedures, the integrated circuit devices being of the type to have an identification code, the process comprising:

• storing data in association with an individual identification code of each of the integrated circuit devices indicating each of the integrated circuit devices undergoes one of special testing and standard testing;
• reading the individual identification code of each of the integrated circuit devices;
• accessing the data stored in association with the individual identification code of each of the integrated circuit devices;
• and
• sorting the integrated circuit devices during the standard testing in accordance with the accessed data for those integrated circuit devices undergoing the special testing.

An integrated circuit manufacturing process for separating integrated circuit devices undergoing special testing from a group of integrated circuit devices undergoing standard test procedures, the integrated circuit devices having an identification code, the process comprising:

• storing fabrication deviation data in association with an individual identification code of at least one of the integrated circuit devices indicating the at least one integrated circuit device undergoes the special testing;
• reading the individual identification code of the at least one integrated circuit device;
• accessing the fabrication deviation data stored in association with the individual identification code of the at least one integrated circuit device;
• and
• sorting the integrated circuit devices in accordance with the accessed data for the at least one integrated circuit device undergoing the special testing.

An integrated circuit manufacturing process for separating integrated circuit devices undergoing special testing from a group of integrated circuit devices that have undergone standard test procedures, the integrated circuit devices having an identification code, the process comprising:

• storing data in association with an individual identification code of at least one of the integrated circuit devices that indicates the at least one integrated circuit device undergoes the special testing;
• reading the individual identification code of the at least one integrated circuit device;
• accessing the data stored in association with the individual identification code of the at least one integrated circuit device;
• and
• sorting the integrated circuit devices in accordance with the accessed data for the at least one integrated circuit device undergoing the special testing.

An integrated circuit manufacturing process for using special test data generated by a first group of integrated circuit devices undergoing special testing to sort a second group of integrated circuit devices into those integrated circuit devices to undergo the special testing and those integrated circuit devices to undergo standard testing after the inspection of the integrated circuit devices, the integrated circuit devices having an identification code, the process comprising:

• storing data in association with an individual identification code of at least one of the second group of integrated circuit devices indicating the at least one of the second group of integrated circuit devices undergoes the special testing;
• storing special test data generated by the first group of integrated circuit devices in association with the individual identification code of the at least one of the second group of integrated circuit devices indicating the at least one of the second group of integrated circuit devices undergoes the standard testing instead of the special testing;
• reading the individual identification code of the at least one of the second group of integrated circuit devices;
• accessing the data stored in association with the individual identification code of the at least one of the second group of integrated circuit devices;
• and
• sorting the second group of integrated circuit devices in accordance with the accessed data so the at least one of the second group of integrated circuit devices undergoes the standard testing.