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AssigneeSamsung Electronics Co., Ltd.
InventorsJae-Hoon Kim, Dong-Il Seo, Hyo-Jin Oh
Estimating the term…
A semiconductor memory device and a failed cell address programming circuit usable therein. The semiconductor memory device as packaged includes a memory cell array having a plurality of memory cells accessed by an internal address, a plurality of redundant memory cells accessed by a failed cell address of a failed memory cell for repairing a failed memory cell, a comparator for comparing data output from the memory cells during testing the semiconductor memory device as packaged and generating a comparative correspondence signal, a mode setting register for storing an externally applied failed cell address programming control signal in response to a mode control signal, an address generating circuit for generating the internal address by buffering and latching an externally applied address, a failed cell address programming circuit for latching the internal address output from the address generating circuit in response to the failed cell address programming control signal when the comparative accordance signal indicates that a failed memory cell is detected and programming the failed cell address which is an address for accessing the failed memory cell; and a failed cell address decoding circuit for generating a redundant selection signal when the internal address output from the address generating circuit and the failed cell address output from the failed cell address programming correspond.
A semiconductor memory device, comprising:
A failed cell address programming circuit of a semiconductor memory device having a memory cell array having a plurality of memory cells accessed by an internal address, a plurality of redundant memory cells accessed by a failed cell address of a failed memory cell, a comparator for generating a comparative output signal after comparing data output from the memory cell array during testing the semiconductor memory device as packaged and an address generator for generating the internal address by buffering and latching an externally applied address, said failed cell address programming circuit comprising:
A method for programming a failed cell address of a failed memory cell of a memory cell array with a plurality of memory cells accessed by an internal address, a plurality of redundant memory cells accessed by the failed cell address, a comparator for generating a comparative output signal after comparing data output from the memory cell array during testing of the semiconductor memory device as packaged and an address generator for generating the internal address by buffering and latching an externally applied address, said method comprising:
A semiconductor memory device, comprising:
Dependencies are inferred from the claim text.