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US 6,788,089 B2Granted
Method and apparatus for inspecting and integrated circuit by measuring voltage on a signal line
AssigneeKoninklijke Philips Electronics N.V.
InventorsJohannes P. M. Van Lammeren, Taco Zwemstra
Life of this patent
Estimating the term…
Abstract
The method for inspecting an integrated circuit comprising a plurality of sub-circuits includes the determination of the supply current into at least one of the sub-circuits. This supply current is determined, while the other sub-circuits are operational, by measuring the voltage over a segment of the supply line through which this supply current flows. This supply line contains no additional components to facilitate the measuring of the voltage.
Claims6
A method for inspecting an integrated circuit, the method comprising:
- measuring a voltage over a segment of a signal line;
- and
- determining a signal current flowing through the signal line on the basis of the voltage and the resistance of the segment of the signal line,
- wherein inspection of the integrated circuit is performed on the basis of the determined signal current.
1 more element
An integrated circuit comprising:
- a signal line;
- and
- a current measuring device for determining a current in the signal line,
- wherein the current measuring device comprises a voltage measuring device connected across a segment of the signal line, said voltage measuring device being adapted to measure a voltage over a segment of the signal line, and
- wherein the current measuring device determines the current on the basis of the measured voltage and an inherent resistance of the segment.
2 more elements
Dependencies are inferred from the claim text.