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US 6,788,087 B2Granted
Integrated circuit having a test circuit, and method of decoupling a test circuit in an integrated circuit
AssigneeInfineon Technologies AG
InventorRainer Florian Schnabel
Life of this patent
Estimating the term…
Abstract
The integrated circuit has a test circuit, which is connected to an input terminal of the integrated circuit via a line connection. An isolating device is provided between an input terminal of the test circuit in order to completely isolate the line connection between the test circuit and the input terminal after the test circuit has performed a test procedure.
Claims16
An integrated circuit, comprising:
- at least one functional circuit;
- a test circuit for testing said functional circuit in a test procedure;
- a signal line connecting said test circuit to said functional circuit;
- and
- an isolating device connected in said signal line for physically isolating said signal line after an operation of said test circuit in the test procedure.
2 more elements
A decoupling method, which comprises the following steps:
- providing an integrated circuit having a test circuit connected via a signal line;
- initiating a test procedure in the integrated circuit with a test mode signal for the test circuit;
- testing the integrated circuit with the test circuit;
- terminating the test procedure;
- and
- permanently interrupting a signal line with which the test circuit is connected.
3 more elements
Dependencies are inferred from the claim text.